ToF-SIMS

ToF-SIMS

Materials Analysis by Mass Spectrometry

by J. C. Vickerman, David Briggs

732 pages· 2013· ISBN 9781906715175
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About
Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is the most versatile of the surface analysis techniques that have been developed during the last 30 years. This is the Second Edition of the first book ToF-SIMS: Surface analysis by Mass Spectrometry to be dedicated to the subject and the treatment is comprehensive

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