Manoj Sachdev

• Thermal and Power Management of Integrated Circuits
• 2000 IEEE International Workshop on Defect Based Testing
• CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies
• Defect oriented testing for CMOS analog and digital circuits
• Defect-oriented testing for nano-metric CMOS VLSI circuits
• Thermal and Power Management of Integrated Circuits
• Thermal and Power Management of Integrated Circuits (Integrated Circuits and Systems)
• CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies