John C. Stover

• Flatness, roughness, and discrete defect characterization for computer disks, wafers, and flat panel displays
• Flatness, roughness, and discrete defects characterization for computer disks, wafers, and flat panel displays II
• Optical scatter
• Optical scattering
• Optical scattering
• Optical Scattering in the Optics, Semiconductor, and Computer Disk Industries
• Scatter from optical components
• Surface Characterization for Computer Disc Wafers
• Optical scattering