Briggs, D.

1948

• Handbook of x-ray and ultraviolet photoelectron spectroscopy
• Sediments
• Surface analysis by Auger and x-ray photoelectron spectroscopy
• ToF-SIMS
• Handbook of static secondary ion mass spectrometry
• Industrial adhesion problems
• Practical surface analysis
• Surface analysis of polymers by XPS and static SIMS
• A survey of niobium alloys and their strengthening mechanisms