Readfeed

G. S. Mathad

  • Copper Interconnects, New Contact Metal- Lurgies, & Low-k DielectricsCopper Interconnects, New Contact Metal- Lurgies, & Low-k Dielectrics
  • Copper Interconnects, New Contact Metallurgies, Structures, and Low-k Interlevel DielectricsCopper Interconnects, New Contact Metallurgies, Structures, and Low-k Interlevel Dielectrics
  • Copper Interconnects, New Contact Metallurgies/structures, and Low-k Interlevel Dielectrics IICopper Interconnects, New Contact Metallurgies/structures, and Low-k Interlevel Dielectrics II
  • Highly Selective Dry Etching and Damage Control (Advances in Soil Science)Highly Selective Dry Etching and Damage Control (Advances in Soil Science)
  • Interconnect and contact metallization for ULSIInterconnect and contact metallization for ULSI
  • Plasma etching processes for sub-quarter micron devicesPlasma etching processes for sub-quarter micron devices
  • Plasma Processing XIIPlasma Processing XII
  • Proceedings of the symposia on reliability of semiconductor devices/interconnections and dielectric breakdown, and laser process for microelectronic applicationsProceedings of the symposia on reliability of semiconductor devices/interconnections and dielectric breakdown, and laser process for microelectronic applications
  • Proceedings of the Tenth Symposium on Plasma ProcessingProceedings of the Tenth Symposium on Plasma Processing
  • Thin film materials, processes and reliabilityThin film materials, processes and reliability
  • Copper Interconnects, New Contact Metallurgies/structures, and Low-k Interlevel DielectricsCopper Interconnects, New Contact Metallurgies/structures, and Low-k Interlevel Dielectrics
  • Pattern Transfer in Integrated Circuit FabricationPattern Transfer in Integrated Circuit Fabrication