A. Christou

• Integrating Quality and Reliability into Microelectronics Manufacturing (Design and Measurement in Electronic Engineering)
• Electromigration and electronic device degradation
• Gallium Arsenide and Related Compounds, 1987 (International Symposium on Gallium Arsenide and Related Compounds// Papers)
• Integrating reliability into microelectronics manufacturing
• Reliability of gallium arsenide MMICs
• Reliability of gallium arsenide MMICs
• Reliability of high temperature electronics
• Semiconductor Device Reliability
• Automated scanning low-energy electron probe (ASLEEP) for semiconductor wafer diagnostics