Michael T. Postek

• Scanning electron microscopy
• Critical Issues in Scanning Electron Microscope Metrology
• Integrated Circuit Metrology, Inspection, and Process Control VI
• Integrated Circuit Metrology, Inspection, And Process Control VII
• Microlithography and metrology in micromachining
• Microlithography and metrology in micromachining II
• Nanostructure science, metrology, and technology
• Instrumentation, metrology, and standards for nanomanufacturing II
• Instrumentation, metrology, and standards for nanomanufacturing III
• Instrumentation, metrology, and standards for nanomanufacturing III
• Instrumentation, metrology, and standards for nanomanufacturing IV
• Instrumentation, metrology, and standards for nanomanufacturing, optics, and semiconductors V